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ATE Test System

  • ua银河澳门_澳门银银河下载bb电子
  • ua银河澳门_澳门银银河下载bb电子

    ua银河澳门_澳门银银河下载bb电子

  • Product description: COC/COS testing machine series automatic testing machine series, suitable for various DFB, EML, FP and other chips packaged in COC or COS form
  • INQUIRY
  • Product introduction:
    1. Support LIV scanning, PD monitoring, EA scanning, spectrum test.
    2. Keithley standard source meter, high power/sampling accuracy and fast speed.
    3. TEC+ water cooling temperature control, maximum support -40~150C temperature control test.
    4. Platform design, through rapid replacement of probe holders to achieve compatibility testing of multiple products.
    5. Carrier transfer between aging and testing, no need to disassemble the product, simple and convenient without risk.
    6. Fully automated testing, supporting automatic testing of 256pcs products at one time.

    Specifications:

    Test category

    Test item

    LIV

    LIV Curve

    Voltage @ Set Iop

    Power @ Set Iop

    Threshold Current (Ith)

    Series Resistance (Rs)

    Slope Efficiency (SE)

    Leak Current

    Power Conversion Efficiency (PCE)

    Kink

    Spectrum Width (FWHM & RMS)

    EA

    EA Curve

    OMA Curve

    ER Curve

    Von Best

    Spectrum

    Peak Wavelength

    RMS

    SMSR

    Parameters can be added according to customer needs