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ATE Test System

  • ua银河澳门_澳门银银河下载bb电子
  • ua银河澳门_澳门银银河下载bb电子

    ua银河澳门_澳门银银河下载bb电子

  • Product description: VCSEL automated testing machine series (Wafer Level & Die Level), suitable for i-TOF&d-TOF&speckle VCSEL Array, Single Eimtter VCSEL
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  • Product introduction:

    1. Support LIV+ spectrum test, CW, QCW conditions can be freely configured.
    2. Support Near Filed test, including Uniformity, Beam Waist, M2, divergence angle test.
    3. Support Far Field test, including Eyesafty and DIP test.
    4. Use TEC + water cooling method for temperature control, with high temperature stability and large controllable range.
    5. Modular design, three test functions can be arbitrarily selected.



    Specifications:

    Test category

    Test item

    LIV

    LIV Curve

    Voltage @ Iop

    Power @ Iop

    Threshold Current (Ith)

    Series Resistance (Rs)

    Slope Efficiency (SE)

    Leak Current (or VRB)

    Power Conversion Efficiency (PCE)

    Center Wavelength (λc)

    Spectrum Width (FWHM & RMS)

    NF

    Uniformity

    M2

    Divergent Angle

    Beam Waist

    FF

    Divergence Angle

    Max power through 7mm aperture

    DIP

    Parameters can be added according to customer needs