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Burn In system

  • ua银河澳门_澳门银银河下载bb电子
  • ua银河澳门_澳门银银河下载bb电子

    ua银河澳门_澳门银银河下载bb电子

  • Product description: Optical chip reliability test system, suitable for DFB, DML, EML, DBR, etc.
  • INQUIRY
  • Product introduction:
    ◆ Mass production system: more than 100 units are delivered in batches for stable operation, and excellent ESD EOS protection ensures 100% product safety
    ◆ The best delivery time: fully automatic production debugging, delivery time within 2 months
    ◆ Drive board: no overshoot, high reliability, high precision
    ◆ Temperature control system: independent heating system, flexible configuration of different temperature zone conditions
    ◆ Fixture: fishbone carrier, up to 100% crimping success rate
    ◆ Software: mature software running for more than 20,000 hours, early warning, real-time data display, MES support, data upload
    ◆ Optional: online optical power monitoring, online LIV, EA scanning function


    Specifications

    System layers

    10 floors

    Dimensions

    W1170 mm × H2050 mm × D900 mm

    Weight

    1000KG

    Machine capacity

    10 layers * 4 drawers * 32DUT = 1280 DUT

    Temperature control

    Temperature control method

    Drawer electric heating independent temperature control

    Temperature range

    40℃~130℃(Can be customized according to customer needs)

    Temperature control resolution

    0.1

    Temperature accuracy

    0.1

    Temperature uniformity

    ±1.0℃

    Temperature stability

    0.5

    Heating time

    > 10 ℃ /min

    Board drive capability (current source, voltage source, four-quadrant drive source, adapted according to different products, take current source as an example)

    Current drive range

    0-500mA

    Current setting accuracy

    0.1% F.S.± 50uA

    Current readback accuracy

    0.1% F.S.± 50uA

    Current setting resolution

    50uA

    Current ripple

    <2%, below 20MHz

    Current noise

    <3%, less than 20MHz

    DUT voltage

    0-5v, can be set according to DUT

    Online optical power monitoring

    Yes

    Laser wavelength

    Customized according to customer products

    Optical power range

    Customized according to customer products

    LIV scan

    Yes

    PD model

    Customized according to customer products

    Laser wavelength

    Customized according to customer products

    Optical power range

    Customized according to customer products

    Scan time

    Single DUT scanning and report output, the total drawing time is less than 10s. Can be customized and optimized according to customer products.

    Scan repeatability

    Do not load the product repeatedly, scan 7 times continuously, the calculated change rate of the threshold current is less than 1%